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? integrated circuits group lh 28 f 16 0 s 3 ns - l 10 fla sh me mor y 16 m ( 2 m b 8 / 1 mb 16 ) (model no.: lh f 16ka1 ) spec no.: el 1 2 80 39 issue date: a ugu st 2 2 , 20 0 0 p roduc t s pecific a tions
sharp lhflgkal l handle this document carefully for it contains material protected by international copyright law. any reproduction, full or in part, of this material is prohibited without the express written permission of the company. l when using the products covered herein, please observe the conditions written herein and the precautions outlined in the following paragraphs. in no event shall the company be liable for any damages resulting from failure to strictly adhere to these conditions and precautions. (1) the products covered herein are designed and manufactured for the following application areas. when using the products covered herein for the equipment listed in paragraph (2), even for the following application areas, be sure to observe the precautions given in paragraph (2). never use the products for the equipment listed in paragraph (3). l office electronics l instrumentation and measuring equipment *machine tools l audiovisual equipment *home appliance *communication equipment other than for trunk lines (2) those contemplating using the products covered herein for the following equipment which demands high reliability, should first contact a sales representative of the company and then accept responsibility for incorporating into the design fail-safe operation, redundancy, and other appropriate measures for ensuring reliability and safety of the equipment and the overall system. l control and safety devices for airplanes, trains, automobiles, and other transportation equipment amainframe computers l traff ic control systems *gas leak detectors and automatic cutoff devices orescue and security equipment mother safety devices and safety equipment, etc. (3) do not use the products covered herein for the following equipment which dem?nds extremely high performance in terms of functionality, reliability, or accuracy. *aerospace equipment *communications equipment for trunk lines . *control equipment for the nuclear power industry *medical equipment related to life support, etc. (4) please direct all queries and comments regarding the interpretation of the above three paragraphs to a sales representative of the company. l please direct all queries regarding the products covered herein to a sales representative of the company. rev.1.9
sharp lhflgkal 1 contents page page i introduction ...................................................... 3 1 .l product overview.. .............................................. 3 ! principles of operation.. .............................. 6 2.1 data protection ................................................... 7 i bus operation.. .................................................. 7 3.1 read ................................................................... 7 3.2 output disable ..................................................... 7 3.3 standby.. ............................................................. 7 3.4 deep power-down .............................................. 7 3.5 read identifier codes operation.. ....................... 8 3.6 query operation.. ................................................ 8 3.7 write.. .................................................................. 8 5 design considerations ................................ .30 5.1 three-line output control ................................ .30 5.2 sts and block erase, full chip erase, (multi) word/byte write and block lock-bit configuration polling.. ............................................................. .30 5.3 power supply decoupling ................................. .30 5.4 v,, trace on printed circuit boards.. ............... .3r 5.5 vc,, v,,, rp# transitions.. ............................... 3? 5.6 power-up/down protection.. ............................. .3? 5.7 power dissipation .............................................. 3? command definitions.. ..................................... 8 4.1 read array command.. ..................................... 11 4.2 read identifier codes command.. .................... 11 4.3 read status register command.. ..................... 11 4.4 clear status register command.. ..................... 11 4.5 query command.. ............................................. 12 4.51 block status register.. ................................ 12 4.5.2 cfi query identification string.. ................... 13 4.5.3 system interface information.. ..................... 13 4.5.4 device geometry definition ......................... 14 4.5.5 scs oem specific extended query table . . 14 4.6 block erase command.. .................................... 15 4.7 full chip erase command ................................ 15 4.8 word/byte write command.. ............................. 16 4.9 multi word/byte write command.. .................... 16 4.10 block erase suspend command.. ................... 17 4.11 (multi) word/byte write suspend command ... 17 4.12 set block lock-bit command.. ........................ 18 4.13 clear block lock-bits command.. ................... 18 4.14 sts configuration command ......................... 19 6 electrical specifications.. ........................ .3: 6.1 absolute maximum ratings ............................... 3: 6.2 operating conditions ........................................ .3: 6.2.1 capacitance ................................................. 3: 6.2.2 ac input/output test conditions.. ............... .3: 6.2.3 dc characteristics.. ..................................... .3l 6.2.4 ac characteristics - read-only operations .3( 6.2.5 ac characteristics - write operations.. ....... .3e 6.2.6 alternative ce#controlled writes.. ............. .41 6.2.7 reset operations ......................................... 4: 6.2.8 block erase, full chip erase, (multi) word/byte write and block lock-bit configuration performance.. ........................ .44 7 additional information ............................... .4e 7.1 ordering information ......................................... .4e 8 package and packing speclflcatlbn........4 7 . rev. 1.9
sharp lhflgkal 2 lh28f160s3nslio 16m-bit (2mbx8/1 mbxl6) smart 3 flash memory a smart 3 technology - 2.7v or 3.3v vcc - 2.7v, 3.3v or 5v vpp n common flash interface (cfi) - universal & upgradable interface n scalable command set (scs) n high speed write performance - 32 bytes x 2 plane page buffer - 2.7 @byte write transfer rate n high speed read performance - 1 oons(3.3vk0.3v), 120ns(2.7v-3.6v) n operating temperature - 0c to +7o?c n enhanced automated suspend options - write suspend to read - block erase suspend to write - block erase suspend to read i high-density symmetrically-blocked architecture - thirty-two 64k-byte erasable blocks i sram-compatible write interface i user-configurable x8 or x16 operation n enhanced data protection features - absolute protection with vpp=gnd - flexible block locking - erase/write lockout during power transitions n extended cycling capability - 100,000 block erase cycles - 3.2 million block erase cycles/chip n low power management - deep power-down mode - automatic power savings mode decreases icc in static mode n automated write and erase - command user interface - status register n industry-standard packaging - 56-lead ssop n etoxtm? v nonvolatile flash technology n cmos process (p-type silicon substrate) n not designed or rated as radiation hardened . sharp?s LH28F160S3NS-L10 flash memory with smart 3 technology is a high-density, low-cost, nonvolatile, ,ead/write storage solution for a wide range of applications. its symmetrically-blocked architecture, flexible voltage ind extended cycling provide for highly flexible component suitable for resident flash arrays, slmms and memory :ards. its enhanced suspend capabilities provide for an ideal solution for code + data storage applications. for iecure code storage applications, such as networking, where code is either directly executed out of flash or downloaded to dram, the LH28F160S3NS-L10 offers three levels of protection: absolute protection with v,, at snd, selective hardware block locking, or flexible software block locking. these alternatives give designers ultimate control of their code security needs. -he lh28f160s3ns-llo is conformed to the flash scalable command set (scs) and the common flash interface cfi) specification which enable universal and upgradable interface, enable the highest system/device data transfer ates and minimize device and system-level implementation costs. -he lh28f160s3nsllo is manufactured on sharp?s 0.35pm etox tm* v process technology. it come in idustry-standard package: the 56-lead ssop ideal for board constrained applications. etox is a trademark of intel corporation. rev.1.9
shari= lhflgkal 3 1 introduction this datasheet contains lh28f160s3ns-llo specifications. section 1 provides a flash memory overview. sections 2, 3, 4, and 5 describe the memory organization and functionality. section 6 covers electrical specifications. 1.1 product overview the lh28f160s3ns-llo is a high-performance 16m- bit smart 3 flash memory organized as 2mbx8/1mbxlg. the 2mb of data is arranged in thirty-two 64k-byte blocks which are individually erasable, lockable, and unlockable in-system. the memory map is shown in figure 3. smart 3 technology provides a choice of vcc and v,, combinations, as shown in table 1, to meet system performance and power expectations. 2.n vc, consumes approximately one-fifth the power of 5v vcc. vp, at 2.7v, 3.3v and sj eliminates the need for a separate 12v converter, while v,,=5v maximizes erase and write performance. in addition to flexible erase and program voltages, the dedicated v,, pin gives complete data protection when vppsvpplk. table 1. i/,.. and vpp voltage combinations offe%d by smart 3 technology vcc voltage vpp voltage 2.7v 2.7v, 3.3v, 5v 3.3v 3.3v, 5v internal vcc and vp, detection circuitry automatically configures the device for optimized *cad and write operations. 4 command user interface (cui) serves as the nterface between the system processor and internal operation of the device. a valid command sequence written to the cui initiates device automation. an nternal write state machine (wsm) automatically mecutes the algorithms and timings necessary for ilock erase, full chip erase, (multi) word/byte write and block lock-bit configuration operations. 4 block erase operation erases one of the device?s i4k-byte blocks typically within 0.41s (3.3v vcc, 5v ipp) independent of other blocks. each block can be ndependently erased 100,000 times (3.2 million ilock erases per device). block erase suspend mode allows system software to suspend block erase to ead or write data from any other block. 4 word/byte write is performed in byte increments ypically within 12.95u.s (3.3v vcc, 5v v,,). a multi vord/byte write has high speed write performance of !.7us/byte (3.3v v,,, 5v vp,). (multi) word/byte write suspend mode enables the system to read data or execute code from any other flash memory array location. individual block locking uses a combination of bits and wp#, thirty-two block lock-bits, to lock and unlock blocks. block lock-bits gate block erase, full chip erase and (multi) word/byte write operations. block lock-bit configuration operations (set block lock-bit and clear block lock-bits commands) set and cleared block lock-bits. the status register indicates when the wsm?s block erase, full chip erase, (multi) word/byte write or block lock-bit configuration operation is finished. the sts output gives an additional indicator of wsm activity by providing both a hardware signal of status (versus software polling) and status masking (interrupt masking for background block erase, for example). status polling using sts minimizes both cpu overhead and system power consumption. sts pin can be configured to different states using the configuration command. the sts pin defaults to ry/by# operation. when low, sts indicates that the wsm is performing a block erase, full chip erase, (multi) word/byte write or block lock-bit configuration. sts-high z indicates that the wsm is ready for a new command, block erase is suspended and (multi) word/byte write are inactive, (multi) word/byte write are suspended, or the device is in deep power-down mode. the other 3 alternate configurations are all pulse mode for use as a system interrupt. the access time is 1oons (tavav) over the commercial temperature range (0% to +7o?c) and vc, supply voltage range of 3.ov-3.6v. at lower v,, voltage, the access time is 120ns (2.7v-3.6v). the automatic power savings (aps) feature substantially reduces active current when the device is in static mode (addresses not switching). in aps mode, the typical lccr current is 3 ma at 33v v,,. when either ce,# or ce,#, and rp# pins are at vcc, the loo cmos standby mode is enabled. when the rp# pin is. at gnd, deep power-down mode is enabled which minimizes power consumption and provides write protection during reset. a reset time (tphqv) is required from rp# switching high until outputs are valid. likewise, the device has a wake time (tphel) from rp#-high until writes to the cui are recognized. with rp# at gnd, the wsm is reset and the status register is cleared. the device is available in 56-lead ssop (shrink small outline package). pinout is shown in figure 2. rev. 1.9
sharp lhflgkal -b sts program/erase vw voltage switch * i i i i i t * i 4 kc + gnd cex wex 00 rp# wp# figure 1. block diagram ce,,# a12 :o a13 3 a14 4 4s 5 nc 6 cel# nc 5 a20 9 49 10 ale 11 a17 12 46 13 vcc 14 gnd 15 dq6 16 do14 17 dq7 18 dqls 19 s-6 20 oe# 21 we# 22 wp# 23 dqn 24 dq5 25 dq12 26 dq4 vcc ;3 56 55 vpp rp# 54 41 53 ho 52 as 51 a1 2: 48 47 46 43 56 lead ssop 45 a7 pinout 44 43 gnd a? 1.8mm x 16mm x 23.7mm top view 42 41 40 dqa dqo a0 byte# nc nc dq2 dqlo dq3 dqrl gnd . figure 2. ssop 56-lead pinout rev. 1.9
sharp symbol *o-*20 dqo-dq, ceo% ce,# rp# oe# we# sts wp# byte# ?pp ?cc gnd nc type input input/ output input input input input open drain output input input supply supply supply / 1 i i i i i i ( t \ i ; : ( r lhflgkal 5 table 2. pin descriptions name and function address inputs: inputs for addresses durinq read and write operations. addresses are internally latched during a write cycle. ao: byte select address. not used in x16 mode(can be floated). ai-ak column address. selects 1 of 16 bit lines. asals: row address. selects 1 of 2048 word lines. a16420 : block address. data input/outputs: dqo-dq,:lnputs data and commands during cui write cycles; outputs data during memory array, status register, query, and identifier code read cycles. data pins float to high- impedance when the chip is deselected or outputs are disabled. data is internally latched during a write cycle. dqs-dq,s:lnputs data during cui write cycles in x16 mode; outputs data during memory array read cycles in xl 6 mode; not used for status register, query and identifier code read mode. data pins float to hiqh-impedance when the chio is deselected, outouts are disabled, or in x8 mode(by~e#=v,, ). data is internally iatched during a write cycle. chip enable: activates the device?s control logic, input buffers decoders, and sense amplifiers. either ce,# or ce,# vlu deselects the device and reduces power consumotion to standby levels. bo?h cer# and ?ce,# must be vi, to select the devices. reset/deep power-down: puts the device in deep power-down mode and resets internal automation. rp# v,, enables normal operation: when driven vi,, rp# inhibits write operations which provides data protection during power transitions. exit from deep power-down sets the device to read array mode. output enable: gates the device?s outputs during a read cycle. write enable: controls writes to the cui and arrav blocks. addresses and data are ? latched on the rising edge of the we# pulse. sts (ry/by#): indicates the status of the internal wsm. when configured in level mode (default mode), it acts as a ry/by# pin. when low, the wsm is performing an internal operation (block erase, full chip erase, (multi) word/byte write or block lock-bit configuration). sts high z indicates that the wsm is ready for new commands, block erase is suspended, and (multi) word/byte write is inactive, (multi) word/byte write is suspended or the device is in deer, dower-down mode. for alternate confiaurations of the status pin, see the configuratidn?command. write protect: master control for block locking. when vi,. locked blocks can not be erased and programmed, and block lock-bits can not be set and reset. byte enable: byte# vi, places device in x8 mode. all data is then inout or outout on il. dq,.,, and dq,,, nput buffer. float. byte# v,, places the device in x16 mode , and turns off?the a0 block erase, full chip erase, (multi) word/byte write, block lock- 31t configuration power supply: for erasing array blocks, writing bytes or :onfiguring block lock-bits. with v,+v,,,,, memory contents cannot be altered.,block erase, full chip erase, (multi) word/bvte write and block lock-bit confiauration with an invalid jpp (see dc characteristics) produce spurious results and should n?;;t be attempted. device power supply: internal detection confioures the device for 2.7? or 3.3? operation. to switch from one voltage to another, ramp vcc down to gnd and then ramp /co to the new voltage. do not float any power pins. with vcc5vlk0, all write attempts to he flash memory are inhibited. device operations at invalid vrr voltage (see dc zharacteristics ) produce spurious results and should not be afigmpted. iround: do not float any ground pins. 10 connect: lead is not internal connected: it may be driven or floated. rev. 1.9
sharp lhflgkal 6 2 principles of operation the lh28f160s3nsllo flash memory includes an on-chip wsm to manage block erase, full chip erase, (multi) word/byte write and block lock-bit configuration functions. it allows for: 100% ttl-level control inputs, fixed power supplies during block erase, full chip erase, (multi) word/byte write and block lock-bit configuration, and minimal processor overhead with ram-like interface timings. after initial device power-up or return from deep power-down mode (see bus operations), the device defaults to read array mode. manipulation of external memory control pins allow array read, standby, and output disable operations. status register, query structure and identifier codes can be accessed through the cui independent of the vp, voltage. high voltage on vp, enables successful block erase, full chip erase, (multi) word/byte write and block lock-bit configuration. all functions associated with altering memory contents-block erase, full chip erase, (multi) word/byte write and block lock-bit configuration, status, query and identifier codes-are accessed via the cui and verified through the status register. commands are written using standard nicroprocessor write timings. the cui contents serve as input to the wsm, which controls the block erase, ?ull chip erase, (multi) word/byte write and block lock- oit configuration. the internal algorithms are *egulated by the wsm, including pulse repetition, nternal verification, and margining of data. addresses and data are internally latch during write :ycles. writing the appropriate command outputs array data, accesses the identifier codes, outputs query structure or outputs status register data. interface software that initiates and polls progress of block erase, full chip erase, (multi) word/byte write and block lock-bit configuration can be stored in any block. this code is copied to and executed from system ram during flash memory updates. after successful completion, reads are again possible via the read array command. block erase suspend allows system software to suspend a block erase to -cad or write data from any other block. write suspend allows system software to suspend a (multi) nerd/byte write to read data from any other flash nemory array location. figure 3. memory map j rev. 1.9
sharp lhflgkal 7 2.1 data protection depending on the application, the system designer may choose to make the v,, power supply switchable (available only when block erase, full chip erase, (multi) word/byte write and block lock-bit configuration are required) or hardwired to vpphlj2/a. the device accommodates either design practice and encourages optimization of the processor-memory interface. when v+vpplk, memory contents cannot be altered. the cui, with multi-step block erase, full chip erase, (multi) word/byte write and block lock-bit zonfiguration command sequences, provides orotection from unwanted operations even when high joltage is applied to v,,. all write functions are disabled when vc, is below the write lockout voltage dlko or when rp# is at v,,. the device?s block ocking capability provides additional protection from nadvertent code or data alteration by gating block erase, full chip erase and (multi) word/byte write iperations. 3.2 output disable with oe# at a logic-high level (vi,), the device outputs are disabled. output pins dc&-dq,, arc placed in a high-impedance state. 3.3 standby either ce,# or ce,# at a logic-high level (vi,) place5 the device in standby mode which substantiali\ reduces device power consumption. dqc-dq, r 3 bus operation the local cpu reads and writes flash memory in- system. all bus cycles to or from the flash memory :onform to standard microprocessor bus cycles. 3.1 read nformation can be read from any block, identifier :odes, query structure, or status register independent )f the v,, voltage. rp# must be at v,,. -he first task is to write the appropriate read mode :ommand (read array, read identifier codes, query )r read status register) to the cui. upon initial levice power-up or after exit from deep power-down node, the device automatically resets to read array node. five control pins dictate the data flow in and but of the component: ce# (ce,#, ce,#), oe#, we#, 3p# and wp#. ce,#, ce,# and oe# must be driven ctive to obtain data at the outputs. ce,#, ce,# is ie device selection control, and when active enables ie selected memory device. oe# is the data output dqc-dq,,) control and when active drives the elected memory data onto the i/o bus. we# and ip# must be at v,,. figure 17, 18 illustrates a read ycle. outputs are placed in a high-impedance stat; independent of oe#. if deselected during block erase, full chip erase, (multi) word/byte write ant block lock-bit configuration, the device continues functioning, and consuming active power until the operation completes. 3.4 deep power-down rp# at v,, initiates the deep power-down mode. in read modes, rp#-low deselects the memory places output drivers in a high-impedance state ant turns off all internal circuits. rp# must be held low for a minimum of 100 ns. time tphav is required after return from power-down until initial memory access outputs are valid. after this wakeup interval, normal operation is restored. the cui is reset to read array mode and status register is set to 80h. during block erase, full chip erase, (multi) word/byte write or block lock-bit configuration modes, rp#-low will abort the operation. sts remains low until the reset operation is complete. memory contents being altered are no longer valid; the data may be partially erased or written. time t,,,, is required after rp# goes to logic-high (v,,) before another command can be written. as with any automated device, it is important to assert rp# during system reset. when the system comes out of reset, it expects to read from the flash memory. automated flash memories provide status information when accessed during block erase, full chip erase, (multi) word/byte write and block lock-bit configuration. if a cpu reset occurs with no flash memory reset, proper cpu initialization may not occur because the flash memory may be providing status information instead of array data. sharp?s flash memories allow proper cpu initialization following a system reset through the use of the rp# input. in this application, rp# is controlled by the same reset# signal that resets the system cpu.
sharp lhf16kal 8 ,5 read identifier codes operation 3.6 query operation ie read identifier codes operation outputs the anufacturer code, device code, block status codes r each block (see figure 4). using the manufacturer id device codes, the system cpu can automatically atch the device with its proper algorithms. the ock status codes identify locked or unlocked block !tting and erase completed or erase uncompleted indition. the query operation outputs the query structure. query database is stored in the 48byte rom. query structure allows system software to gain critical information for controlling the flash component. query structure are always presented on the lowest- order data output (dc&-dq,) only. 3.7 write 1ffffft : ,. .. . . : :. reserved for y? ?.. future implementation lfocc6 .. lfocij5- l_______lll_--------------------- lfooq4 block 31 status code _____ -_------------ ------------- lfoco3 .. reserved for 1foooc. future implementation block 31 ieffff:. y .. . . : ()2f3joo; :. .. (blocks 2 through 30) ., : .i olffff reserved for future tmpfementafion . 010006 ___l______-_-l-l--l-________________^_ 010005 010004 block 1 status code ________________ ---------------------- 010003 reserved for omoo : ooffff future implementation block 1 reserved for future implementation ooooo6 -____------_-------------------------- 000005 ocmo4 block 0 status code ________---------------------------- device code __________--_-_--------------------- manufacturer code writing commands to the cui enable reading of device data and identifier codes. they also control inspection and clearing of the status register. when vcc=vcc1,2 and ?jpp=vpph1/2/3, the cui additionally controls block erase, full chip erase, (multi) word/byte write and block lock-bit configuration. the block erase command requires appropriate command data and an address within the block to be erased. the word/byte write command requires the command and address of the location to be written. set block lock-bit command requires the command and block address within the device (block lock) to be locked. the clear block lock-bits command requires the command and address within the device. the cui does not occupy an addressable memory location. it is written when we# and ce# are active. the address and data needed to execute a command are latched on the rising edge of we# or ce# (whichever goes high first). standard microprocessor write timings are used. figures 19 and 20 illustrate we# and ce#-controlled write operations. 4 command definitions when the v,, voltage 2 v,,lk, read operatrons from the status register, identifier codes, query, or blocks are enabled. placing v,,,,,,, on v,, enables successful block erase, full chip erase, (multi) word/byte write and block lock-bit configuration operations. device operations are selected by writing specific commands into the cui. table 4 defines these commands. ?igure 4. device identifier code memory map rev. 1.9
sharp lhf16kal mode read output disable standby table 3. bus operations(byte#=v& 1 notes 1 rp# ( ce,# 1 ce,# / oe# 1 we# 1 address 1 vpp i dqnm15 i sts x v,, v,, v,, v,h x x dn,,r v,, v,, v,h v,h x x highz x vi, vi, vih vi, x x x x high z x iotes: . refer to dc characteristics. when vpp shari= lhflgkal command read array/reset read identifier codes table 4. bus cycles req?d querv i 22 i 1 write 1 x i 98h i read i qa i qd read status register clear status register block erase setup/confirm full chip erase setup/confirm word/byte write setup/write alternate word/byte write setup/write write write write write write write 576 58 wa / 10h 1 write 1 wa ( wd wa write wa =b n-l write write (multi) word/byte write resume i 3 block lock-bit set setup/confirm 2 7 block lock-bit reset r) 0 uun =i= 60h write 60h write setup/confirm l cl sts configuration level-mode for erase and write i write i x i b8h i write i x i ooh (ry/by# mode) sts configuration pulse-mode for erase 0 i in,-:&- i x b8h write x olh i l i vvlllt: sts configuration pulse-mode for write sts configuration pulse-mode for erase and write iotes: 2 2 write x write x b8h b8h write x write x 02h 03h . bus operations are defined in table 3 and table 3.1. ?. x=any valid address within the device. ia=ldentifier code address: see figure 4. qa=query offset address. ba=address within the block being erased or locked. wa=address of memory location to be written. . srd=data read from status register. see table 14 for a description of the status register bits. wd=data to be written at location wa. data is latched on the rising edge of we# or ce# (whichever goes high first). id=data read from identifier codes. . qd=data read from query database. . following the read identifier codes command, read operations access manufacturer, device and block status codes. see section 4.2 for read identifier code data. . if the block is locked, wp# must be at vi, to enable block erase or (mufti) word/byte write operations. attempts to issue a block erase or (multi) word/byte write to a locked block while rp# is v,,. . either 40h or 10h are recognized by the wsm as the byte write setup. a block lock-bit can be set while wp# is v,,. , wp# must be at v,, to clear block lock-bits. the clear block lock-bits operation simultaneously clears all block lock-bits. following the third bus cycle, inputs the write address and write data of ?n? times. finally, input the confirm command ?doh?. 3. commands other than those shown above are reserved by sharp for future device implementations and should not be used. rev. 1.9
shari= lhflgkal 11 4.1 read array command 4.3 read status register command upon initial device power-up and after exit from deep power-down mode, the device defaults to read array mode. this operation is also initiated by writing the read array command. the device remains enabled for reads until another command is written. once the internal wsm has started a block erase, full chip erase, (multi) word/byte write or block lock-bit configuration, the device will not recognize the read array command until the wsm completes its operation unless the wsm is suspended via an erase suspend and (multi) word/byte write suspend :ommand. the read array command functions ndependently of the v,, voltage and rp# must be jih- 1.2 read identifier codes command the status register may be read to determine when z block erase, full chip erase, (multi) word/byte write o block lock-bit configuration is complete and whethe the operation completed successfully(see table 14) it may be read at any time by writing the read statu: register command. after writing this command, al subsequent read operations output data from the status register until another valid command is written the status register contents are latched on the fallins edge of oe# or ce#(either cec# or ce,#) whichever occurs. oe# or ce#(eithei ce,# or ce,#; must toggle to vi, before further reads to update the status register latch. the read status register command functions independently of the v,, voltage rp# must be vi,. the identifier code operation is initiated by writing the qead identifier codes command. following the :ommand write, read cycles from addresses shown in ?igure 4 retrieve the manufacturer, device, block lock :onfiguration and block erase status (see table 5 for dentifier code values). to terminate the operation, vrite another valid command. like the read array :ommand, the read identifier codes command unctions independently of the v,, voltage and rp# nust be vi,. following the read identifier codes :ommand, the following information can be read: table 5. identifier codes code address manufacture code 00000 00001 data bo device code 00002 00003 do *last erase operation did not completed successfully oreserved for future use iote: dq,=l dqps7 the extended status register may be read tc determine multi word/byte write availability(see table 14.1). the extended status register may be read al any time by writing the multi word/byte writs command. after writing this command, all subsequenl read operations output data from the extended status register, until another valid command is written. multi word/byte write command must be re-issued to update the extended status register latch. 4.4 clear status register command status register bits sr.5, sr.4, sr.3 and sr.1 are set to ?1?s by the wsm and can only be reset by the clear status register command. these bits indicate various failure conditions (see table 14). by allowing system software to reset these bits, several operations (such as cumulatively erasing or locking multiple blocks or writing several bytes in sequence) may be performed. the status register may be polled to determine if an error occurs during the sequence. to clear the status register, the clear status register command @oh) is written. it functions independently of the applied v,, voltage. rp# must be vi,. this command is not functional during block erase, full chip erase, (multi) word/byte write block lock-bil configuration, block erase suspend or (multi) word/byte write suspend modes. . x selects the specific block status code to be read. see figure 4 for the device identifier code memory map. rev. 1.9
sharp lhflgkal 12 4.5 query command query database can be read by writing query :ommand (98h). following the command write, read cycle from address shown in table 7-l 1 retrieve the xitical information to write, erase and otherwise :ontrol the flash component. ac of query offset address is ignored when x8 mode (byte#=v,,). table 6. example of query structure output mode offset address output dq, q-a dq7-,, a,, a,, a,, a29 a,, a, 1 , 0 , 0 , 0 , 0 , 0 (20h) high z ?q? x8mode 1,0,0,0,0,1(21h) highz ?q? 1, o,o,o,l ,0(22h) highz ?r? 1 , 0 , 0 , 0 , 1 , 1 (23h) high z ?r? 3uery data are always presented on the low-byte lata output (dqc-dq,). in x16 mode, high-byte dqs-dq,,) outputs ooh. the bytes not assigned to iny information or reserved for future use are set to ?0?. this command functions independently of the ipp voltage. rp# must be v,,. ag, a,, a,, a,, a, x16mode 1 ,o,o,o,o (10h) ooh ?q? l,o,o,o,l (11h) ooh ?r? 1.5.1 block status register -his field provides lock configuration and erase status for the specified block. these informations are only availablt vhen device is ready (sr.7=1). if block erase or full chip erase operation is finished irregulary, block erase statu: rit will be set to ?1?. if bit 1 is ?l?, this block is invalid. offset (word address) (ba+2)h table 7. query block status register length description olh block status register bit0 block lock configuration o=block is unlocked 1 =block is locked lote: bit1 block erase status o=last erase operation completed successfully 1 =last erase operation not completed successfully bit2-7 reserved for future use . ba=the beginning of a block address. . rnw 1 a
shari= lhflgkal 13 4.5.2 cfi query identification string the identification string provides verification that the component supports the common flash interface specification. additionally, it indicates which version of the spec and which vendor-specified command set(s) is(are: supported. offset (word address) loh,l lh,12h 13h,14h table 8. cfi query identification string length description 03h query unique ascii string ?qry? 51 h,52h,59h 02h primary vendor command set and control interface id code -l5h,16h 02h 17h,18h 02h lsh,lah 02h 01 h,oih (scs id code) address for primary algorithm extended query table 31 h,ooh (scs extended query table offset) alternate vendor command set and control interface id code ooooh (ooooh means that no alternate exists) address for alternate algorithm extended query table ooooh (ooooh means that no alternate exists) 4.5.3 system interface information the following device information can be useful in optimizing system interface software. offset (word address) 1bh 1ch 1dh 1eh 1fh 20h 21h 22h 23h 24h 25h 26h table 9. system information string length description olh vcc logic supply minimum write/erase voltage 27h (2.7v) 01h vcc logic supply maximum write/erase voltage 55h (5.5v) olh v,, programming supply minimum write/erase voltage 27h (2.7v) olh v,, programming supply maximum write/erase voltage 55h (5.5v) olh typical timeout per single byte/word write 03h (23=8us) olh typical timeout for maximum size buffer write (32 bytes) 06h (2?-j=64us) olh typical timeout per individual block erase oah (oah=lo, 2r?=1 024ms) olh typical timeout for full chip erase ofh (ofh=15, 215=32768ms) olh maximum timeout per single byte/word write, 2n times of typical. 04h (24=16, 8usx16=128us) olh maximum timeout maximum size buffer write, 2n times of typical. 04h (24=1 6, 64usx16=1024us) olh maximum timeout per individual block erase, 2n times of typical. 04h (24=1 6, 1024msxl6~16384ms) olh maximum timeout for full chip erase, 2n times of typical. 04h (24=1 6, 32768msxl6=524288ms) rev. 1.9
shari= lhflgkal 14 3.5.4 device geometry definition rhis field provides critical details of the flash device geometry. off set (word address) 27h 28h,29h 2ah,2bh 2ch 2dh,2eh 2fh,30h table 10. device geometry definition length description olh device size 15h (15h=21,221=20971 52=2m bytes) 02h flash device interface description 02h,ooh (x8/x1 6 supports x8 and xl 6 via byte#) 02h maximum number of bytes in multi word/byte write 05h,ooh (25=32 bytes ) olh number of erase block regions within device 01 h (symmetrically blocked) 02h the number of erase blocks 1 fh,ooh (1 fh=31 ==> 31 +1=32 blocks) 02h the number of ?256 bytes? cluster in a erase block ooh,ol h (01 ooh-13256 ==>256 bytes x 256= 64k bytes in a erase block) 1.55 scs oem specific extended query table :ertain flash features and commands may be optional in a vendor-specific algorithm specification. the optional endor-specific query table(s) may be used to specify this and other types of information. these structures are efined solely by the flash vendor(s). off set (word address) 31 h,32h,33h 34h 35h 36h,37h, 38h,39h 3ah ibh,3ch 02h idh ieh ifh tat length 03h olh olh 04h olh oih olh reserved e 11. scs oem specific extended query table description optional command support bito=l : chip erase supported bitl=l : suspend erase supported bit2=1 : suspend write supported bit3=1 : lock/unlock supported bit4=0 : queued erase not supported bit5-31=0 : reserved for future use 01h supported functions after suspend bito=l : write supported after erase suspend bitl-7=0 : reserved for future use * 03h,ooh block status register mask bito=l : block status register lock bit [bsro] active bitl=l : block status register valid bit [bsr.l] active bit2-15=0 : reserved for future use vcc logic supply optimum write/erase voltage(highest performance) 50h(5ov) v,, programming supply optimum write/erase voltage(highest performance) 50h(5.ov) reserved for future versions of the scs specification rev i a
sharp lhflgkal 15 4.6 block erase command block erase is executed one block at a time and initiated by a two-cycle command. a block erase setup is first written, followed by an block erase confirm. this command sequence requires appropriate sequencing and an address within the block to be erased (erase changes all block data to ffh). block preconditioning, erase and verify are handled internally by the wsm (invisible to the system). after the two-cycle block erase sequence is written, the device automatically outputs status register data when read (see figure 5). the cpu can detect block erase completion by analyzing the output data of the sts pin or status register bit sr.7. inhen the block erase is complete, status register bit 5r.5 should be checked. if a block erase error is detected, the status register should be cleared before system software attempts corrective actions. the cui .emains in read status register mode until a new :ommand is issued. rhis two-step command sequence of set-up followed )y execution ensures that block contents are not tccidentally erased. an invalid block erase command sequence will result in both status register bits sr.4 rnd sr.5 being set to ?1?. also, reliable block erasure :an only occur when vcc=vcc1,2 and vpp=vpphf,2/3. n the absence of this high voltage, block contents ire protected against erasure. if block erase is ittempted while v,, sharp lhflgkal 16 4.8 word/byte write command word/byte write is executed by a two-cycle command sequence. word/byte write setup (standard 40h or alternate 10h) is written, followed by a second write that specifies the address and data (latched on the rising edge of we#). the wsm then takes over, controlling the word/byte write and write verify algorithms internally. after the word/byte write sequence is written, the device automatically outputs status register data when read (see figure 7). the cpu can detect the completion of the word/byte write event by analyzing the sts pin or status register bit 33.7. when word/byte write is complete, status register bit sr.4 should be checked. if word/byte write error is jetected, the status register should be cleared. the nternal wsm verify only detects errors for ?1?s that jo not successfully write to ?0?s. the cui remains in ?cad status register mode until it receives another zommand. qeliable word/byte writes can only occur when ~cc=vcc1,2 and vpp=vpphln/3. in the absence of :his high voltage, memory contents are protected against word/byte writes. if word/byte write is ittempted while v,@,,,,, status register bits sr.3 snd sr.4 will be set to ?1?. successful word/byte nrite requires that the corresponding block lock-bit be :leared or, if set, that wp#=v,,. if word/byte write is ittempted when the corresponding block lock-bit is ;et and wp#=v,,, sr.l and sr.4 will be set to ?1?. nordlbyte write operations with v,, shari= lhfl6kai 17 4.10 block erase suspend command the block erase suspend command allows block- erase interruption to read or (multi) word/byte-write data in another block of memory. once the block- erase process starts, writing the block erase suspend command requests that the wsm suspend the block erase sequence at a predetermined point in the algorithm. the device outputs status register data when read after the block erase suspend command is written. polling status register bits sr.7 and 93.6 can determine when the block erase operation has been suspended (both will be set to ?1?). sts will also transition to high z. specification twhrh2 defines the block erase suspend latency. at this point, a read array command can be written to read data from blocks other than that which is suspended. a (multi) word/byte write command sequence can also be issued during erase suspend to program data in other blocks. using the (multi) word/byte write suspend command (see section 4.1 l), a (multi) word/byte write operation can also be suspended. during a (multi) word/byte write operation nith block erase suspended, status register bit 33.7 nili return to ?0? and the sts (if set to ry/by#) xrtput will transition to v,,. however, sr.6 will ?emain ?1? to indicate block erase suspend status. the only other valid commands while block erase is suspended are read status register and block erase resume. after a block erase resume :ommand is written to the flash memory, the wsm nili continue the block erase process. status register iits sr.6 and sr.7 will automatically clear and sts will return to vo,. after the erase resume command s written, the device automatically outputs status egister data when read (see figure 10). v,, must emain at v,,,,,zs (the same v,, level used for jlock erase) while block erase is suspended. rp# must also remain at v,,. block erase cannot resume until (multi) word/byte write operations initiated during block erase suspend have completed. 4.11 (multi) word/byte write suspend command the (multi) word/byte write suspend command allows (multi) word/byte write interruption to read data in other flash memory locations. once the (multi) word/byte write process starts, writing the (multi) word/byte write suspend command requests that the wsm suspend the (multi) word/byte write sequence at a predetermined point in the algorithm. the device continues to output status register data when read after the (multi) word/byte write suspend command is written. polling status register bits sr.7 and sr.2 can determine when the (multi) word/byte write operation has been suspended (both will be set to ?1?). sts will also transition to high z. specification twhrhl defines the (multi) word/byte write suspend latency. at this point, a read array command can be written to read data from locations other than that which is suspended. the only other valid commands while (multi) word/byte write is suspended are read status register and (multi) word/byte write resume. after (multi) word/byte write resume command is written to the flash memory, the wsm will continue the (multi) word/byte write process. status register bits sr.2 and sr.7 will automatically clear and sts will return to vol. after ?the (multi) word/byte write command is written, the device automatically outputs status register data when read (see figure 11). v,, must remain at vpph1,2/3 (the same v,, level used for (multi) word/byte write) while in (multi) word/byte write suspend mode. wp# must also remain at v,, or vi,.
sharp lhf16kal 18 4.12 set block lock-bit command a flexible block locking and unlocking scheme is enabled via block lock-bits. the block lock-bits gate program and erase operations with wp#=v,,, individual block lock-bits can be set using the set block lock-bit command. see table 13 for a summary of hardware and software write protection options. set block lock-bit is executed by a two-cycle command sequence. the set block lock-bit setup along with appropriate block or device address is written followed by either the set block lock-bit confirm (and an address within the block to be locked). the wsm then controls the set block lock-bit algorithm. after the sequence is written, the device automatically outputs status register data when read (see figure 12). the cpu can detect the completion of the set block lock-bit event by analyzing the sts pin output or status register bit sr.7. when the set block lock-bit operation is complete, status register bit sr.4 should be checked. if an error s detected, the status register should be cleared. the cui will remain in read status register mode until 3 new command is issued. rhis two-step sequence of set-up followed by ?xecution ensures that block lock-bits are not iccidentally set. an invalid set block lock-bit :ommand will result in status register bits sr.4 and jr.5 being set to ?1?. also, reliable operations occur )nly when vcc=vcc1,2 and vpp=vpph1,2/3. in the absence of this high voltage, block lock-bit contents ire protected against alteration. 4 successful set block lock-bit operation requires yp#=v,,. if it is attempted with wp#=v,l, sr.l and jr.4 will be set to ?1? and the operation will fail. set plock lock-bit operations with wp# shari= lhflgkal 19 4.14 sts configuration command the status (sts) pin can be configured to different states using the sts configuration command. once the sts pin has been configured, it remains in that configuration until another configuration command is issued, the device is powered down or rp# is set to vi,. upon initial device power-up and after exit from deep power-down mode, the sts pin defaults to ry/by# operation where sts low indicates that the wsm is busy. sts high z indicates that the wsm is ready for a new operation. to reconfigure the sts pin to other modes, the sts configuration is issued followed by the appropriate configuration code. the three alternate configurations are all pulse mode for use as a system interrupt. the sts configuration command functions independently if the v,, voltage and rp# must be v,,. bits ooh 01h table 12. st! configuratior 02h 03h s, effects set sts pin to default level mode (ry/by#). ry/by# in the default level-mode of operation will indicate wsm status condition. set sts pin to pulsed output signal for specific erase operation. in this mode, sts provides low pulse at the completion of block erase, full chip erase and clear block lock-bits operations. set sts pin to pulsed output signal for a specific write operation. in this mode, sts provides low pulse at the completion of (multi) byte write and set block lock-bit operation. set sts pin to pulsed output signal for specific write and. erase operation. sts provides low pulse at the completion of block erase, full chip erase, (multi) word/byte write and block lock-bit configuration operations. configuration coding description table 13. write protection alternatives operation block erase, (multi) word/byte write block lock-bit wp# effect 0 v,, or vi,, block erase and (multi) word/byte write enabled i i block is locked. block erase and (multi) word/bvte write f 1 full chip erase set block lock-bit clear block lock-bits o,l x x x \i, vi, v kli v v v v v . , , disabled block lock-bit override. block erase and (multi) word/byte write enabled all unlocked blocks are erased, locked blocks are not erased all blocks are erased set block lock-bit disabled set block lock-bit enabled clear block lock-bits disabled . clear block lock-bits enabled
sharp lhflgkai 20 table 14. status register definition wsms 1 bess 1 ecblbs 1 wsblbs 1 vpi=?s 1 wss dps r 7 6 5 4 3 2 1 0 notes: sr.7 = write state machine status 1 = ready check sts or sr.7 to determine block erase, full chip 0 = busy erase, (multi) word/byte write or block lock-bit configuration completion. sr.6 = block erase suspend status 1 = block erase suspended 0 = block erase in progress/completed sr.5 = erase and clear block lock-bits status 1 = error in erase or clear bloc1 lock-bits sr.6-0 are invalid while sr.7=??. if both sr.5 and sr.4 are ?1?s after a block erase, full chip erase, (multi) word/byte write, block lock-bit configuration or sts configuration attempt, an improper command sequence was entered. 0 = successful erase or clear block lock-bits sr.3 does not provide a continuous indication of v,, level. the wsm interrogates and indicates the v,, level sr.4 = write and set block lock-bit status only after block erase, full chip erase, (multi) word/byte 1 = error in write or set block lock-bit write or block lock-bit configuration command 0 = successful write or set block lock-bit sequences. sr.3 is not guaranteed to reports accurate feedback only when v,,#v,,,tius. sr.3 = v,, status 1 = v,, low detect, operation abort sr.l does not provide a continuous indication of block o=v,,ok lock-bit values. the wsm interrogates block lock-bit, and wp# only after block erase, full chip erase, (multi) sr.2 = write suspend status word/byte write or block lock-bit configuration command 1 = write suspended sequences. it informs the system, depending on the 0 = write in progress/completed attempted operation, if the block lock-bit is set and/or sr.1 = device protect status wp# is not v,,. reading the block lock configuration codes after writing the read identifier codes command 1 = block lock-bit and/or wp# lock detected, indicates block lock-bit status. operation abort 0 = unlock sr.0 is reserved for future use and should be masked out when polling the status register. sr.0 = reserved for future enhancements sms r 7 6 table 14.1. extended status register definition r r r r 5 4 3 2 r r 1 0 notes: xsr.7 = state machine status 1 = multi word/byte write available 0 = multi word/byte write not available after issue a multi word/byte write command: xsr.7 indicates that a next multi word/byte write command is available. xsr.g-o=reserved for future enhancements xsr.g-0 is reserved for future use and should be masked out when polling the extended status register. rev.l.9
shari= f road status register full status check procedure (e) block erase successful lhflgkal 21 read status dstaloh rqster addhx i read status re+ter data i check sr.7 l-w.%4 ready o=.wsm busy write etase setup data-zjh acklbwitim block to be erased i writ.3 i daqdoh a&jr-withm block to be erased i repeat for subsequent block emsures. full status dwck can t-a done after each block erase or aftor a sequence of block erasums. write ffh after the last operation to place device in mad army mode. standby check sr.4.5 both l=command sequence error standby . check sr.5 l=block erase erm~ sr.s.sr.4.sr.3 and sr.l are only cleared by the clear ?&ha register command in cases where multiple blocks are erased before full status is checked. if wmris detected. clear the status register before attempting ?by or other ermr recovery. figure 5. automated block erase flowchart
sharp r lhf16kal !3arl * wnta 70h + read status g-tack if desired complete full status check procedure reed status raglstw data(sw above) full chip erase succwdlll bm opmaon commvld commenta wrilo read slandbl read status register data70h addhx status register data check sr.7 l-w%4 ready oiwsm busy wit0 writ0 read standby full chop erase sbjp futl chip erate conflml data&oh addr-x datapdoh addhx status regoster data check sr.7 1 pwsm ready o=wsm busy full status check can be done after each full chip emse. write ffh after the last operation to place device in mad army mode. blu opfdlon command comments standby chedc sr.3 l=vpp ermr detect check sr.4,5 b& l-command sequence enor staml~ check sr.5 t-full chip erase emx i srs.sr.4.sr.3 and sr.l am only cleared by the clear status register command in cases where multiple blocks are erased before full status is checked. if error is detected, clear the status register before attempting retry or olher ermr recovery. figure 6. automated full chip erase flowchart rev. 1.9
shari= lhflgkal 23 data and addmss read status regirtm data complete fullstatuscheckprocedure read st&us register data(see above) bus oprdion command commmb writ9 read standby data-7oh addr-x status rogirter data check sr.7 l=wsm redy o=wsm susy wlite write setup wordmyte data-4oh or 10h write addr=locatfwl to be written data-data to be wdtten wofd/syta write addr=localion to be written standby check sr.7 l=wsm ready o=wsm busy repeat for subsequent word/byte writes. sr lull status check can be done after each wo&byte write. or after a requenee of worcuayte wdtes. write ffh after the last vmrdmyie write operation to place device in mad army mode. command comments standby check sr.3 l=vpp error detect check sr.1 standby standby ladevice protect detect wp#=vil.sfock lock-sit is set only required for systems implementing lock-bit configuration . check sr.4 l-data write error sr.4.sr.3 and 33.1 am only cleared by the clear status rqster command in cases where multiple locations are written before full stahls is checked. if error is detected. clear tie status register before attempting retry or ouler envr recovery. figure 7. automated word/byte write flowchart i ps,, i a
sharp lhflgkal 24 figure 8. automated multi word/byte write flowchart suspend multi word/byte full status check if dewed command comments write dz9ta-ebh =w multi wordlsyte write addr-staft addross read standby exb3ti status register data check xsr.7 1im?lti woldbyte writs ready omulti word/byte write busy write (notal) wflte (note2.3) wnte (note4.5) write data-word or byte count (n)-1 addr..start address data=b?ffer data addwstart address dataz8uffer data addr-device address data-ooh addr-x read status register data check sr.7 standby i =wsm ready o..w.sm busy 1. byte or word count values on do,,., are loaded into the count register. 2. write buffer contents mll be programmed at me start address. 3. align tie start address on a write buffer boundary for maximum pmgramming performance. 4.the device aborts the multi wad/&b write command if the current address is oulside of the original block address. s.the status regtster tindicates an ?improper command sequence? if the multi wotiyte command is aborted. follow this with a clear status register command. sr full status check can be done after each multi wrdmyte write, or after a sequence 01 multi wadbyte writes. write ffh after the last multi wordbyte write operation to place device in read array mode.
sharp lhflgkal 25 full status checic procedure for mlltl worcmbyie write operation device protect error bus opwalfon command commmt9 check sr.3 l=vpp error detect check sr.1 1ldwico pmtect detect wp*iv,~.b!g~ l&-sit is set only mquimd for syslams implementing lock-bit configuration check sr.4.5 both f-command sequence ermr check sr.4 1=data write error sr.s.sr.4.sfi.3 and sr.1 are only cleared by the clear status rqster cammmd in cases where multiple locations am written before m status is checked. if enorb detected, clear the status f?a#er before attempting mly or other emr mcwety. figure 9. full status check procedure for automated multi word/byte write
sharp lhflgkal c> sr.7p o 1 (mulli) worrubyte write loop wnte doh c write ffh i i btm opwlion commmd caatmanb writ0 read data-b0h addhx statur rogistar data addhx stancby check sa.7 l.wsm rae&j oiwsm busy standby chodcsr.0 11btock erase surpw~ied o-block erase completed wti ento rasuma da&&oh addr-x figure 10. block erase suspend/resume flowchart rpv iq
sharp lhf16kal 27 + %i.?= 0 1 (multi) wofcubyte write completed wtita ffh i i bus 0-n i command i commenta 1 wli(e 1 (multi) wad/byte wtite data-soh suspend 1 addh* i_ chedc sr.2 l.(multl) wordbyte write smpwlded 0+4ulti) wordbyte write completed write read array data-ffh ac!dr=x f write figure 11. (multi) word/byte write suspend/resume flowchart
sharp lhflgkal 28 resd status register t-? 0 six?= 1 check if desired fullstatuscheckprocedtjre read stah~o register data(see abwe) device protect ermr set block lock-&t successful bus op&ioll command fzommmta write set block leek-bit seh~p daradoh addr=slock address wlile sat block lock-sit confin data-01 h. addr-block address rsad status register data check sr.7 l=wsm ready oawsm busy repeat for subsequent block lock-bit set operations. full status chock can be done after each block lock-btt set operation or after a sequence of block lock-bit set operatiwn. w&e ffh after the last blak lock-bit set operation to place device in read array mode. 1 owl? / timmand / fhnmsnb standby check sr.3 trvpp error detect standby check sr.l l=dence pmtect detect wp#?v,l standby check sr.4.5 both l=command sequence error standby check sr.4 t-set block lock-sit error srs.sr.4.sr.3 and sr.1 are only dewed by the clear status regwterccmmand in casas where multiple block lock-bits are set before full status is checked. if ermr is detected. clear the status register before attempbng retry or omer error recovery. figure 12. set block lock-bit flowchart rev. 1.9
sharp lhflgkal 29 + sr.7.. o 1 full status check procedure read status register data&see above) i device protect error clear block lock-bits successful bus opdh cammmd comments writ9 wlikl ckr block lock-sits setup clear sbck lock-sib confirm data&h addhx data-doh addr=x read status register data check sr.7 s-w 1 -wsm ready oiwsm busy write ffh after the clear block lock-bits operation to place dwice in read army mode. bus opfirthl command comments standby check sr.3 l=vpp error detect standby chock sr. 1 l=devlce protect detect wpim,l standby check sr.4,5 both i-command sequence error standby check sr.5 i-clear block lock-bits ermr sr.s.sr.4sr.3 and sr., are onb deared by the clear status registercommand. if enor is detected. dear the stabls register bebre attempting figure 13. clear block lock-bits flowchart rev-l.9
sharp lhflgkal 30 5 design considerations 5.1 three-line output control the device will often be used in large memory arrays. sharp provides three control inputs to accommodate multiple memory connections. three- line control provides for: a. lowest possible memory power dissipation. b. complete assurance that data bus contention will not occur. to use these control inputs efficiently, an address decoder should enable ce# while oe# should be connected to all memory devices and the system?s read# control line. this assures that only selected memory devices have active outputs while deselected memory devices are in standby mode. 3p# should be connected to the system ?owergood signal to prevent unintended writes during system power transitions. powergood should also toggle during system reset. 5.2 sts and block erase, full chip erase, (multi) word/byte write and block lock-bit configuration polling 5ts is an open drain output that should be :onnected to vcc y b a pullup resistor to provide a lardware method of detecting block erase, full chip ?rase, (multi) word/byte write and block lock-bit :onfiguration completion. in default mode, it ransitions low after block erase, full chip erase, multi) word/byte write or block lock-bit configuration :ommands and returns to voh when the wsm has inished executing the internal algorithm. for rlternate sts pin configurations, see the >onfiguration command. ;ts can be connected to an interrupt input of the #ystem cpu or controller. it is active at all times. 1 sts, in default mode, is also high z when the device is in block erase suspend (with (multi) word/byte writs inactive), (multi) word/byte write suspend or deef power-down modes. 5.3 power supply decoupling flash memory power switching characteristics require careful device decoupling. system designers are interested in three supply current issues; standby current levels, active current levels and transienl peaks produced by falling and rising edges of ce#i and oe#. transient current magnitudes depend or the device outputs? capacitive and inductive loading. two-line control and proper decoupling capacitor selection will suppress transient voltage peaks. each device should have a o.luf ceramic capacitor connected between its vcc and gnd and between its v,, and gnd. these high-frequency, low inductance capacitors should be placed as close as possible tc package leads. additionally, for every eight devices, a 4.7uf electrolytic capacitor should be placed at the array?s power supply connection between vco and gnd. the bulk capacitor will overcome voltage slumps caused by pc board trace inductance. 5.4 vpp trace on printed circuit boards updating flash memories that reside in the target system requires that the printed circuit board designer pay attention to the v,, power supply trace. the v,, pin supplies? the memory cell current for block erase, full chip erase, (multi) word/byte write and block lock-bit configuration. use similar trace widths and layout considerations given to the vcc power bus. adequate v,, supply traces and decoupling will decrease v,, voltage spikes and overshoots. . 2 rev. 1.9
sharp. lhflgkal 5.5 vcc, vpp, rp# transitions powers-up first. internal circuitry resets the cui tl read array mode at power-up. block erase, full chip erase, (multi) word/byte write and block lock-bit configuration are not guaranteed if v,, falls outside of a valid vpphi12/s range, vco falls outside of a valid vccir range, or rp#=v,,. if v,, error is detected, status register bit sr.3 is set to ?1? along with sr.4 or sr.5, depending on the attempted operation. if rp# transitions to v,, during block erase, full chip erase, (multi) word/byte write or block lock-bit configuration, sts(if set to ry/by# mode) will remain low until the reset operation is complete. then, the operation will abort and the device will enter deep power-down. the aborted operation may leave data partially altered. therefore, the command sequence must be repeated after normal operation is restored. device power-off or rp# transitions to v,, clear the status register. the cui latches commands issued by system software and is not altered by v,, or ce# transitions or wsm actions. its state is read array mode upon dower-up, after exit from deep power-down or after vcc transitions below vlko. \fter block erase, full chip erase, (multi) word/byte write or block lock-bit configuration, even after v,, :ransitions down to v,,,,, the cui must be placed in .ead array mode via the read array command if subsequent access to the memory array is desired. 5.6 power-up/down protection the device is designed to offer protection against iccidental block and full chip erasure, (multi) vordlbyte writing or block lock-bit configuration during )ower transitions. upon power-up, the device is ndifferent as to which power supply (v,, or v,,) a system designer must guard against spuriou: writes for vcc voltages above vlko when v,, i: active. since both we# and ce# must be low for i command write, driving either to vi,.., will inhibit writes the cul?s two-step command sequence architecturt provides added level of protection against dat: alteration. in-system block lock and unlock capability prevent! inadvertent data alteration. the device is disable{ while rp#=v,, regardless of its control inputs state. 5.7 power dissipation when designing portable systems, designers mus consider battery power consumption not only during device operation, but also for data retention during system idle time. flash memory?s nonvolatilio increases usable battery life because data is retainec when system power is removed. in addition, deep power-down mode ensures extremely low power consumption even when systerr power is applied. for example, portable computing products and other power sensitive applications tha use an array of devices for solid-state storage car consume negligible power by lowering rp# to v,, standby or sleep modes. if access is again needed the devices can be read following the tphav ant tphwl wake-up cycles required after rp# is firsi raised to v,,. see ac characteristics- read only and write operations and figures 17, 18, 19, 20 for more information. rev. 1.9
sharp lhf16kal 32 6 electrical specifications 6.1 absolute maximum ratings* operating temperature during read, erase, write and block lock-bit configuration . . . . . . ..o?c to +7o?c(?) temperature under bias . . . . . . . . . . . . . . . -10c to +80x storage temperature . . . . . . . . . . . . . . . . . . . . . . . . -65c to +125?c voltage on any pin (except v,,, v,,) . . . . . . . . . . . . . . . -0.5v to vcc+0.5v(2) v,, suply voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.2v to +7.ov(2) vp, update voltage during erase, write and block lock-bit configuration . . . . ..-0.2v to +7.ov(2) 3utput short circuit current . . . . . . . . . . . . . . . . . . . . . . . . 100ma(3) *warning: stressing the device beyond the ?absolute maximum ratings? may cause permanent damage. these are stress ratings only. operation beyond the ?operating conditions? is not recommended and extended exposure beyond the ?operating conditions? may affect device reliability. notes: 1. operating temperature is for commercial temperature product defined by this specification. 2. all specified voltages are with respect to gnd. minimum dc voltage is -0.5v on input/output pins and -0.2v on voo and vp, pins. during transitions, this level may undershoot to -2,ov for periods c20ns. maximum dc voltage on input/output pins and vo, is vco+0.5v which, during transitions, may overshoot to vcc+2.0v for periods <20ns. 3. output shorted for no more than one second. no more than one output shorted at a time. 5.2 operating conditions temperature and vcr: operating conditions symbol parameter min. max. unit test condition td operating temperature 0 +70 ?c ambient temperature vcc, vor: supply voltage (2.7v-3.6v) 2.7 3.6 v vcc:, vcn supply voltage (3.3v*o.3v) 3.0 3.6 v i.2.1 capacitance(l) symbol parameter c,m input capacitance cn, ,t output capacitance jote: . sampled, not 100% tested. ta=+25?c, f=l mhz typ. max. 7 10 9 12 unit condition pf v,@o.ov pf ?in, ,r=o.ov . rev. 1.9
lhflgkal 33 i.2.2 ac input/output test conditions ac test inputs are driven at 2.n for a logic ?1 ?* and o.ov for a logic ?0.? input timing begins, and output timing ends, at 1.35v. input rise and fall times (10% to 90%) cl0 ns. figure 14. transient input/output reference waveform for vcc=2.7v-3.6v yi-~z+l-lq~~ ?ac test inputs are driven at 3.ov for a logic ?1? and o.ov for a logic ?0.? input timing begins, and output timing ends, at 1 sv. input rise and fall times (10% to 90%) cl0 ns. figure 15. transient input/output reference waveform for vcc=3.3v*0.3v 1.3v i in914 cl includes jig capacitance figure 16. transient equivalent testing load circuit test configuration capacitance loading value test configuration c, (pf) v~,=3.3v*o.3v,2.7v-3.6v 1 50 . rev.1.9
shari= lhflgkal 34 5.2.3 dc characteristics dc characteristics block erase full chi rev. 1.9
sharp lhflgkal dc characteristics icontinued v,,=2.n vcc=3.3v test sym. parameter notes min. 1 max. min. 1 max. unit conditions vi, input low voltaae 7 -0.5 1 0.8 -0.5 1 0.8 v vi, input high voltage vol output low voltage vohr output high voltage u-w voh2 output high voltage (cmos) vpplk v,, lockout voltage during normal operations vrqqrr v,, voltage during write or erase operations v,,h, v,, voltage during write or erase operations vn,hs v,, voltage during write or erase ooerations 7 2.0 vcc +0.5 2.0 vcc v +0.5 3,7 0.4 0.4 v vcc=vccmin. loi =2ma 317 2.4 2.4 v i?cc=~5c$ oh * 3,7 0.85 0.85 v,, v,, v vcc=vccmin. lo,=-2.%la vcc vcc v vcc=vccmin. -0.4 -0.4 i,,=-1 ooua 497 1.5 1.5 v 2.7 3.6 - - v 3.0 3.6 3.0 3.6 v 4.5 5.5 4.5 5.5 v 1 vcc lockout voltage vi ko iotes: i i l i i 1 1 ( 2.0 j 1 2.0 1 1 v ( . all currents are in rms unless otherwise noted. typical values at nominal v,, voltage and ta=+25?c. * ?ccws and icces are specified with the device de-selected. if read or byte written while in erase suspend mode, the device?s current draw is the sum of icc,, or icces and i,,, or iccw, respectively. . includes sts. . block erases, full chip erases, (multi) word/byte wriies and block lock-bit configurations are inhibited when v&i,,,,, and not guaranteed in the range between vpplk(max.) and vpr+n(min.), between vppht(max.) and vpp&min.), between vpph2(max.) and vp&min.) and above vpphs(max.). . automatic power savings (aps) reduces typical icc, to 3ma at 2.7v and 3.3v vcc in static operation. . cmos inputs are either vcc+0.2v or gnd+0.2v. ttl inputs are either v,, or v,,. . sampled, not 100% tested. . rev.1.9
sharp lhflgkal 36 6.2.4 ac characteristics - read-only operations(?) note: see 3.3v v,, read-only operations for notes 1 through 4. telfl tp, fz!+ ce# low to byte# high or low 3 5 t ns jotes: . i. see ac input/output reference waveform for maximum allowable input slew rate. !. oe# may be delayed up to telqv-fglqv after the falling edge of ce# without impact on telqv. 5. sampled, not 100% tested. c. see ordering information for device speeds (valid operational combinations). rev. 1.9
device address selection address stable sharp lhflgkal 37 , k , \ oe#(g) 1:: vih we#(w) telqv l tgla!, vil . . . . ...??- * klox -* . kloxb * toi-4 --r, voh data( d/q) high z vol ,,......11 4 tavov l kc tphov note: ce# is defined as the latter of ceo# and ce1# going low or the first of ce# or ce1# going high. figure 17. ac waveform for read operations rev. 1.9
sharp lhflgkal 38 r device address selection data valid ,,,11..111 address stable voh data( d/q) high z high z pqe-dqd vol note: ce# is defined as the latter of ceo# and ce,# going low or the first of ceo# or ce# going high. figure 18. byte# timing waveforms rev. 1.9
sharp lhflgkal 39 6.2.5 ac characteristics - write operations(?) &,,,,,,, we# pulse width high tlj#q, we# high to sts going low &&jr,, write recovery before read jflwl vp,, hold from valid srd, sts high z vsi wp# vi,, hold from valid srd, sts high z note: see 3.3v vcc we#-controlled writes for notes 1 through 5. 30 ns 100 ns 0 ns 2,4 0 ns 2,4 0 ns sym. 1 vcc=3.3v*0.3v, ta=o?c to +7o?c versiond5) 1 lh28f16os3-ll oo parameter 1 notes ( min. 1 max. unit tnvnv ) write cycle time 100 ns tpww, rp# high recovery to we# going low 2 1 p 4, w, ce# setup to we# going low 10 ns &, wh we# pulse width 50 ns 2 100 ns ., yetup to we# going high 2 100 ns 50 ns ve# high -3 3 50 ns 5 ns 5 ns tj&r,, write recovery h,,,,, 1 vp,, hold from v: i \nrnll \i u^lrl i-- i high s going low before read slid srd, sts high z urn valid srd, sts high z 1 ??tit ?,h ll?l? ii l 10 i 30 ns 100 ns 0 ns 2,4 0 9 ns 2,4 0 ns i. read timing characteristics during block erase, full chip erase, (multi) wrod/byte write and block lock-bit configuration operations are the same as during read-only operations. refer to ac characteristics for read-only operations. !. sampled, not 100% tested. 1. refer to table 4 for valid a,, and d,, for block erase, full chip erase, (multi) word/byte write or block lock-bit configuration. i. v,, should be held at v,,,,,z, until determination of block erase, full chip erase, (multi) word/byte write or block lock-bit configuration success (sr.1/3/4/5=0). i. see ordering information for device speeds (valid operational combinations). rev. 1.9
sharp lhflgkal 40 1 2 3 4 5 6 -o---o hi addresses(a) vil hi ce#(e) vs. oe#(g) we#(w) data( d/q) sts(r) wp#(s) - il vih vil vih vil vih vil high vol notes: 1. vcc power-up and standby. 2. write erase or write setup. 3. write erase confirm or valid address and data. 4. automated erase or program delay. 5. read status register data. 6. write read array command. 7. ce# is defined as the latter of ceo# and ce,# going low or the first of ce.,# or ce,# going high. figure 19. ac waveform for we#-controlled write operations . rev. 1.9
shari= lhflgkal 6.2.6 alternative ce#-controlled writes(?) sym. 1 vco=2.7v-3.6v, t,=o?c to +7o?c versions@) 1 lh28f16os3-l120 parameter ) notes 1 min. 1 max. unit i 2 100 ns high i data setup to ce# going high i 3 i 50 i ns 3 50 ns ii tfhnv 1 data hold from ce# high note: see 3.3v v,, alternative ce#-controlled writes for notes 1 through 5. i, vcc=3.3v+0.3v, t, tfw&y address hc tfhwh we# hold t&hf, ce# pulse width high tp ,r, ce# high to sts going low tfqn, write reco tnwl vpp hold from valid srd, sts high z 1 2,4 1 0 ii ns h&l wp# vi,, hold from valid srd, sts high z i 24 i 0 ns notes: very before read 100 ns 0 ns i 1. in systems where ce# defines the write pulse width (within a longer we# timing waveform), all setup, hold and inactive we# times should be measured relative to the ce# waveform. * 2. sampled, not 100% tested. 3. refer to table 4 for valid a,, and d,, for block erase, full chip erase, (multi) word/byte write or block lock-bit configuration. 4. v,, should be held at vpph1,2,3 until determination of block erase, full chip erase, (multi) word/byte write or block lock-bit configuration success (sr.1/3/4/5=0). 5. see ordering information for device speeds (valid operational combinations). 1 rev. 1.9
shari= lhflgkal 42 addresses(a) notes: 1. vcc power-up and standby. 2. write erase or write setup. 3. write erase confirm or valid address and data. 4. automated erase or program delay. 5. read status register data. 6. write read array command. 7. ce# is defined as the latter of ceo# and ce# going low or the first of ceo# or ce,# going high. figure 20. ac waveform for ce#-controlled write operations . rev. 1.9
sharp lhf16kal 6.2.7 reset operations high z sts(r) vol rp#(p) vih wl (a)reset during read array mode high z sts( r) vol . bll?h vih rp#(p) vil - blph (b)reset during block erase, full chip erase, (multi) word/byte write or block lock-bit configuretion rp#(p) vih vil i t (c)vcc power up timing figure 21. ac waveform for reset operation reset ac specifications v,,=2.7v v,,=3.3v symbol parameter notes min. max. min. max. unit tplph rp# pulse low time (if rp# is tied to vco, this specification is 100 100 ns not applicable) tplrh rp# low to reset during block erase, full chip erase, (multi) word/byte write 1,2 21.5 21.1 ijs or block lock-bit configuration b3vph v,, at 2.7v to rp# high 3 100 100 i vcn at 3.ov to rp# high ns notes: 1. if rp# is asserted while a block erase, full chip erase, (multi) word/byte write or block lock-bit configuration operation is not executing, the reset will complete within loons. . 2. a reset time, tphqv, is required from the latter of sts going high z or rp# going high until outputs are valid. 3. when the device power-up, holding rp# low minimum 100ns is required after v,, has been in predefined range and also has been in stable there. rev. 1.9
shari= lhflgkal 44 5.2.8 block erase, full chi lock-bit configuratk sym. iote: parameter word/bvte write time (using w/b write, in word mode) word/byte write time (using w/b write, in byte mode) word/bvte write time , (using multi word/byte write) block write time (using w/b write, in word mode) block write time (using w/b write, in byte mode) block write time (using multi word/byte write) block erase time full chip erase time set block lock-bit time clear block lock-bits time write suspend latency time to read erase suspend latency time to read d erase, (multi) word/byte write and block in performance@) 2 5.76 250 5.76 250 2.76 180 ps 2 1 0.73 1 8.2 1 0.73 1 8.2 / 0.44 1 4.8 1 s 2 / 1.31 1 16.5 1 1.31 1 16.5 1 0.87 1 10.9 1 s 2 0.37 4.1 0.37 4.1 0.18 2 s 2 0.56 10 0.56 10 0.42 10 s i i i i i i i 1 17.9 1 320 1 17.9 1 320 1 13.4 i 320 1 s 2 1 22.17 1 250 1 22.17 1 250 1 13.2 1 180 1 11s i i i i i i i 2 ) 0.56 1 10 1 0.56 1 10 1 0.42 1 10 1 s i ! i i i t i 1 7.24 1 10.2 ( 7.24 1 10.2 1 6.73 1 9.48 1 ps 1 15.5 1 21.5 1 15.5 1 21.5 1 12.54 1 17.54 1 us i i i i i ice 3.3v v,, block erase, full chip erase, (multi) word/byte write and block lock-bit configuration performance x notes 1 through 3. . rev. 1.5
sharp lhflgkal 45 i word/b block write time (using w/b write, in word mode) 2 0.72 8.2 0.43 4.8 s block write time (using w/b write, in byte mode) 2 1.28 16.5 0.85 10.9 s block write time s-l i\ n)e ?1 0.18 2 s (using multi word/byte write) l u.jw +. t whqv* b?, block erase time 2 0.55 10 0.41 10 s full chip erase time 17.6 320 13.1 320 s i twhqvs set block lock-bit time 2 21.75 250 12.95 180 ijs t whqv4 tfho?d clear block lock-bits time 2 0.55 10 0.41 10 s rwhrh1 write susoend latencv time to read 7.1 10 6.6 9.3 us phrh2 erase suspend latency time to read 15.2 21.1 12.3 17.2 ijs fhflh7 notes: 1. typical values measured at ta=+25?c and nominal voltages. assumes corresponding block lock-bits are not set. subject to change based on device characterization. 2. excludes system-level overhead. 3. sampled but not 100% tested. rev. 1.9
sharp lhflgkal 46 additional information 1 ordering information product line designator for all sharp flash products ~~~~1.6101s~~~~~~si-/l~1~0~ u w device density access speed (ns) 160 = 16-mbit p- 10:loons (3.3v), 120ns (2.7v) architecture 13: 130ns (3.3v), 150ns (2.7v) s = regular block ii package power supply type t = 56-lead tsop 3 = smart 3 technology r = 56-lead tsop(reverse bend) ns = 56-lead ssop operating temperature b = 64-ball csp blank = 0c - +7o?c d = 64-lead sdip h = -40c - +85?c valid operational combinations v,,=2.7v-3.6v v~~=3.3v*o.3v 5opf load, 5opf load, $tion order code 1.35v l/o levels 1.5v i/o levels 1 lh28f160s3ns-llo lh28f16os3-l120 lh28f16os3-ll oo rev. 1.9
sharp 47 8 package and packing specification i laorage conditions. i-1storage conditions required before opening the dry packing. * normal temperature : 5-40c l normal humidity : 80% r.h. max. 1-2.storage conditions required after opening the dry packing. in order to prevent moisture absorption after opening, ensure the following storage conditions apply: (1) storage conditions for one-time soldering. (convection reflow, iwconvection reflow, v.p.s., or manual soldering. > * temperature : 5-25c * humidity : 60% r .h. max. l period : 72 hours max. after opening. (2) storage conditions for two-time soldering. (convection reflow, irkonvection reflow.) a. storage conditions following opening and prior to performing the 1st reflow. l temperature : 5-25c. l humidity : 60% r.h. max. * period : 72 hours max. after opening. b. storage conditions following completion of the 1st reflow and prior to performing the 2nd reflow. * temperature : 5-25?c, * humidity : 60 % r .h. max. * period : 72 hours max. after completion of the 1st reflow. 1-3.temporai-y storage after opening. to restore the devices before soldering, do so only once and use a dry box or place desiccant (with a blue humidity indicator) with the devices and perform dry packing again using heat-sealing. the storage period, temperature and humidity must be as follows : (1) storage temperature and humidity. z 1 : external atmosphere temperature and humidity of the dry packing. first opening+ xl---+ re-sealing + y __) re-opening b x2---, mounting zl temperature : 5-4ocl 5-25c humidity : 80%r.h. maxi 60%r.h. max. a 0 i i %1 5-40c i i 5-25c f i i i 80%r.h. max. i i 60%r.h. max. i ? * (2) storage period. - xl +x2 : refer to section l-2(1) and (2)a , depending on the mounting method. *y : two weeks max.
sharp lhflgkal 46 2. baking condition. (1) situations requiring baking before mounting. l storage conditions exceed the limits specified in section l-2 or l-3. l humidity indicator in the desiccant was already pink when opened. ( also for re-opening.) (2) recommended baking conditions. l baking temperature and period : 120c for 16-24 hours. * the above baking conditions apply since the trays are heat-resistant. (3) storage after baking. * after baking, store the devices in the environment specified in section 1-2 and mount immediately. 3surface mount conditions. the following soldering condition are recommended to ensure device quality. 3- 1 .soldering. (1) convection reflow or wconvection. (one-time soldering only) * temperature and period : peak temperature of 240c max., above 230c for 15 sec. max. above 200c for 50 sec. max. preheat temperature of 140- 160c for 90f 30 sec. temperature increase rate of lb3?c/sec. * measuring point : ic package surface. * temperature profile : 240c max. 160c temp. increase lbs?c/sec. . time
sharp lhfigkal 49 (2) convection reflow or ifuconvection. (two-time soldering only) * temperature and period : peak temperature of 230c max. above 200c for 50 sec. max. preheat temperature of 140- 160c for 90* 30 sec. temperature increase rate of l-3?c/sec. - measuring point : ic package surface. * temperature profile : 230c max. i temp. increase l--s?c/sec. / time (3) v.p.s.( one-time soldering only > l temperature and period : peak temperature of 215c max., above 200c for 40 sec. max. preheat temperature of 140- 160c for 90+ 30 sec. temperature increase rate of 1&4?c/sec. - measuring point : ic package surface. * temperature profile preheating ( 90 + 30 sec.) preheating ( 90 + 30 sec.) k .._.____.____.___ k . . . . . . . . . . . . . . . . . . . . ? . . . . . . . . . . . . . . . . . . . ? ? temp. increase temp. increase l-4yz/sec. l-4yz/sec. 215c max. time
sharp lhfl6kai 50 (4) manual soldering ( soldering iron ) ( one-time soldering only > soldering iron should only touch the ic?s outer leads. - temperature and period : 350c max. for 3 sec. i pin max., or 260c max. for 10 sec. i pin max. (soldering iron should only touch the it?s outer leads.) l measuring point : soldering iron tip. 4. condition for removal of residual flax. (1) ultrasonic washing power : 25 watts / liter max. (2) washing time : total 1 minute max. (3) solvent temperature : 15-40c
sharp lhflgkal 51 5. package outline spec.i&ation. refer to the attached drawing. 6. markings. 6-l.marking details. (the information on the package should be given as follows.) ( 1) product name : lh28f160s3ns-l.10 (2) company name : sharp (3) date code (example) w ww * denotes the production ref. code (l-3 digits). g denotes the production week. (01 * 02 * - l 52 l 53) denotes the production year. (last two digits of the year.) (4) ?japan? indicates the country of origin. 6-2.marking layout. the layout is shown in the attached drawing. (however, this layout does not specify the size of the marking character and marking position.)
sl-tarp lh-figkai 52 see detail a detail a & " . ? . 0. 8 f0. 15 ?j - f6eb@ ! l\i9+% y, ?i - fw@ 1 lead finish i i tin-lead plating lead material i cu i 5% i g&5 ~~jz5=~9/~~9=-5?9l-%~~i~, /x'jq ame i ssopo56-p-0600 -23e7kt~bcd~t~~ i 0 *4il i note plastic body dimensions do not include burr brawing no. j aa2021 unit i mm of resin. 2000080e
sharp t-9 l-r79 bei marking layout lh28f160s3ns-llo sharp japan yyww xxx 0 ii 1 pin
sharp lhfi6kal - 7.packing specifications (dry packing for surface mount packages.) 7- l.packing materials. material name ) material specifications 1 purpose inner carton 1 cardboard (500 devices / inner carton j packing the devices. ! max. > i j (10 trays i inner carton) nay f conductive plastic (50 devices i tray) ) securing the devices. upper cover tray j conductive plastic (1 tray / inner carton) / securing the devices. laminated aluminum f aluminum polyethylene i keeping the devices dry. bag desiccant j silica gel label 1 paper pp band 1 polypropylene (3 pcs. / inner carton > outer carton / cardboard (2000 devices / outer carton i i max. ) .. i ( devices must be placed on the tray in the same direction.) j keeping the devices dry. i indicates part number, 1 quantity, and packed date. i securing the devices. 1 outer packing. i 7-2.0utline dimension of tray. refer to the attached drawing. 7-3.0utline dimension of carton. refer to the attached drawing. 8. precautions for use. (1) opening must be done on an anti-esd treated workbench. all workers must also have undergone anti-esd treatment. (2) the trays have undergone either conductive or anti-esd treatment. if another tray is used, make sure it has also undergone conductive or anti-esd treatment. (3) the devices should be mounted the devices within one year of the date of delivery. 200008oi i
. e 3 is. 8 !i:3 d 18. 31.0*0.3*9=279.0*0.5 _a 18.4. m t r m m m m m a h-%3-
sharp 56 \ outer carton label two rows l x wx h inner carton - outer dimensions : 335x150x80 outer carton - outer dimensions : 340x310x175 6% i l-l-f!% a%&& #ii* xrbs;73~%&d%g. *tkt%a%q6~~7mose3 me i packing specifications note there is a possibility different from this , i i &cl i specification when the number of shipments drawing no. [ bj433 unit i mm is fractions.

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